NI and Astronics Test Systems, Inc., a wholly owned subsidiary of Astronics Corporation announced their collaborative efforts to deliver PXI-based products designed for the aerospace and defense community. The combination of Astronics’ strength in test system integration and NI’s leadership in PXI-based automated test systems is expected to produce a best-in-class portfolio for automated test equipment (ATE) applications.
“We are focused on providing the latest technology to our customers. This move from VXI to PXI will retain the investments made in test program sets (TPSs) while providing a seamless upgrade path for our popular legacy instruments,” said Jim Mulato, president of Astronics Test Systems Inc. “The ability to collaborate with NI, a leader in PXI, will be a tremendous boost to the long-term sustainability of DoD test systems as we narrow the gap between commercial and military products.”
The first product to be delivered as a result of the collaboration is the Astronics Frequency Time Interval Counter (FTIC) for PXI Express, modeled after the Astronics VXIbus 200 MHz Universal Counter. Designed for full TPS compatibility, the instrument can replace existing VXI-based FTICs and deliver the same capability in a newer PXI-based subsystem. This upgrade was achieved by using the analog circuitry, firmware and driver software in the existing VXI module. Once available, customers can purchase the Astronics FTIC for PXI Express and future products expected to become available as a result of the collaboration, as well as support service, through the worldwide NI sales channel.
“As creator of the PXI platform, and as a long-term technology supplier to the aerospace and defense ATE community, we are excited to see Astronics Test Systems VXI technology making its way into PXI,” said Eric Starkloff, executive vice president of sales and marketing at NI. “This collaboration to make available products that support legacy capability along with our continuing investment in software-designed and synthetic instruments will significantly extend the life of current test programs.”