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Rohde & Schwarz and ETS-Lindgren partner to offer OTA testing solutions for next-gen wireless technologies
05/25/2026 | 692
Rohde & Schwarz and ETS-Lindgren continue their long standing partnership to deliver comprehensive over the air (OTA) testing solutions for next generation wireless technologies. ETS-Lindgren has integrated the CMX500 one box signaling tester and R&S SMBV100B vector signal generator from Rohde & Schwarz into its EMQuest™ software. This collaboration supports the latest standards, including 5G FR1, 5G FR2, Wi Fi 7 and A-GNSS.

Keysight Launches Wireless Coexistence Test Solution to Accelerate Compliance and Innovation
05/22/2026 | 47
Keysight Technologies, Inc. announced the release of its new Wireless Coexistence Test Solution, an automated, and standards-aligned platform designed to help engineers quickly and repeatably validate wireless device performance in increasingly crowded RF environments.

Anritsu Launches TestDeck™ Web Solution to enhance Test & Measurement
05/20/2026 | 40
ANRITSU CORPORATION has launched TestDeck™, a web-based solution designed to promote digital transformation (DX) of mobile device testing. TestDeck integrates test planning, configuration, execution, and results management by connecting multiple communication test and measurement systems to a web server and aggregating test data. This centralized approach streamlines test operations and supports new perspectives in test analysis.

ARDRONIS Wi-Fi: The future of drone detection and mitigation
05/18/2026 | 50
Rohde & Schwarz introduced the next generation of ARDRONIS WiFi: A comprehensive solution for detecting, locating, and mitigating WiFi-controlled drones.

TI enables automakers to advance vehicle autonomy and safety with new chips in its automotive portfolio
05/15/2026 | 49
Texas Instruments (TI) introduced a new portfolio of automotive lidar, clock and radar chips to help automakers transform vehicle safety by bringing more autonomous features to a wider range of cars. TI's new LMH13000, the industry's first integrated high-speed lidar laser driver, delivers ultra-fast rise time to improve real-time decision-making.

Keysight at IMS 2026
05/13/2026 | 90
Join Keysight at IMS 2026 in Boston on June 7, 2026. Industry Professionals including engineers, researchers, and managers in the RF and microwave field will be definitely interested in attending this show.

Yokogawa Test & Measurement Releases PBDH0400 Series High-voltage, Wide-bandwidth Differential Probe
05/11/2026 | 68
Yokogawa Test & Measurement Corporation announced the release of the PBDH0400 Series differential probe with a maximum input voltage of 2000 V and a frequency bandwidth of 400 MHz. The PBDH0400 Series meets the measurement requirements for the development of next-generation higher-speed power devices that can contribute to the realization of a sustainable society.

Tektronix introduces 7 Series DPO, setting a new benchmark in ultra-high-performance test and measurement
05/08/2026 | 73
Powered by proprietary ASICs, the oscilloscope delivers the industry’s lowest noise, highest ENOB, and up to 10x faster data offload.

Industry’s first space-grade 200V GaN FET gate driver from TI helps satellites become smaller and more efficient
05/06/2026 | 91
Ranging from 22V to 200V and supporting different radiation levels, TI’s new family of gate drivers enables designers to improve power system efficiency for every type of space mission.

Keysight Introduces Scalable In-Line Flash Programming System for High-Volume Electronics Manufacturing
05/04/2026 | 81
Keysight Technologies, Inc. announced the Keysight A90 Application-Specific Automated Test Suite (ASATS), a high-throughput in-line flash programming solution designed to help electronics manufacturers efficiently manage increasingly large firmware payloads in high-volume production environments.


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