Rohde & Schwarz joins FormFactor’s MeasureOne partner program

Rohde & Schwarz and FormFactor have been working together for several years to deliver powerful, seamlessly integrated solutions. Rohde & Schwarz provides instruments like the R&S®ZNA , a versatile high-end VNA capable of measuring all key RF parameters which can easily be combined with frequency converters extending frequencies up to the THz range. FormFactor complements this with a comprehensive portfolio of manual, semi-automated, and fully automated probe systems, including advanced thermal control, high-frequency probes, precision probe positioners, and robust calibration tools.

This combined approach allows manufacturers to validate product performance directly during wafer runs, leveraging the expertise of both companies. The tight integration of hardware and software components from both companies is designed to enable fast and reliable testing. The complete solution includes advanced instruments, reliable wafer and die fixturing, and high-precision probe positioning throughout the entire test cycle, strengthening confidence in product quality and performance.

Jens Klattenhoff, SVP and GM of the Systems Business Unit at FormFactor, said: “By expanding our collaboration with Rohde & Schwarz through the MeasureOne program, we are delivering integrated on‑wafer RF test solutions designed to help customers reduce risk, improve efficiency, and accelerate development. This partnership brings together advanced wafer probing and proven RF measurement technologies to address the growing complexity of next‑generation semiconductor devices.”

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www.rohde-schwarz.com