Industry news

Keysight Technologies, Inc. announced that it helped AMD accelerate the testing of electrical compliance for PCI Express® (PCIe) specification for pre-production AMD server CPUs. By providing early access to beta software, Keysight enabled AMD to develop and test a PCI Express technology-capable server motherboard operating at up to 64 GT/s.

Yokogawa Test & Measurement Corporation announced the release of the AQ7290 Series optical time domain reflectometer (OTDR), a highly reliable and accurate optical fiber field test instrument that will ease the support the construction and maintenance of rapidly expanding optical communication networks. The AQ7290 is equipped with new functions that improve operability and workability. Six standard and high-performance models are available in the AQ7290 Series, offering a selection of two or three wavelengths to cover a broad range of fiber-optic installation and maintenance measurement needs.

Rohde & Schwarz invites to its High Speed Digital Cable Testing Seminar that will be held on April 14, 2026. High-speed interconnect design and testing face increasing challenges as data rates rise and system densities grow, making signal integrity and accuracy critical.

Keysight Technologies, Inc. in collaboration with NTT Corporation (NTT) and NTT Innovative Devices Corporation (NTT Innovative Devices), announced a groundbreaking world record in data rate achieved using sub-THz frequencies. This milestone was reached with Keysight's Vector Component Analyzer (VCA) in conjunction with NTT’s and NTT Innovative Devices' high-output, wide-bandwidth J-band Indium Phosphide (InP)-based power amplifier (PA). In addition, advanced digital predistortion techniques were employed to mitigate amplifier non-linearities, ensuring robust, high-fidelity signal generation.

In the evolving 5G landscape, channel-state information (CSI) is essential for optimizing network performance and user capacity. CSI enables efficient channel-dependent scheduling and adaptive modulation, ensuring robust high-speed communications between base station and mobile device. AI/ML-driven CSI enhancements promise even greater efficiency, reduced overhead, and improved user experience in 5G-Advanced and future 6G networks. However, implementation across vendors will be challenging. Rohde & Schwarz and Qualcomm Technologies have achieved an industry milestone by demonstrating cross-vendor interoperability of ML-based CSI feedback enhancements, to be showcased at MWC 2025 in Barcelona.

Keysight Technologies, Inc. expanded its PNA-X Vector Network Analyzer portfolio with the new NA520xA PNA-X, a highly configurable vector network analyzer (VNA) featuring four radio frequency (RF) signal sources, two internal combiners, and two low-noise receivers in a single instrument that accelerates component characterization.

Emerson is expanding access to its field-proven NI PXI test platform with new high-performance hardware at a more affordable price point. These additions make it easier for more engineering teams to adopt scalable, low-cost automated test systems without compromising precision or reliability, while laying the groundwork for AI-enhanced workflows.

Way ahead of the final ratification of the IEEE standard, Rohde & Schwarz has implemented first Wi-Fi 8 RF tests in signaling mode into its CMX500 one-box signaling tester. Validating a prototype next-generation WLAN device from Broadcom, the CMX500 verifies new Wi-Fi 8 physical layer features designed to shift the focus from sheer speed towards ultra-high reliability (UHR) performance of tomorrow’s wireless connectivity.

Join Keysight webinar “Optimizing Imaging System Performance: Balancing Hardware & Software with ImSym” that will be held on March 31, 2026. ImSym enables system level virtual prototyping by integrating optical design, sensor behavior, ISP processing, and stray light effects..

Rohde & Schwarz invites to its seminar "Signal Power Integrity" that will be held on April 2, 2026. The speed and integration of digital systems continue to increase, and this presents challenges for measurement. The increasing level of integration places tight requirements on the voltage accuracy and current levels that must be met to power these systems. In addition, the high-speed serial data interfaces on these devices and systems place strict requirements on signal integrity. This seminar presents instrumentation and best practices for measuring power integrity and signal integrity in these systems.

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