Industry news

RSS

Agilent Technologies' New Vector Network Analyzer Delivers Enhanced Capability, Cost-Effective RF Network Analysis
09/07/2011 | 1935
Agilent Technologies Inc. (NYSE: A) introduced the newest member of its popular ENA Series of network analyzers, the E5072A vector network analyzer. Available as either a two-port, 30-kHz to 4.5-GHz or 8.5-GHz instrument, the E5072A offers improved performance over current RF network analyzers, enhanced functionality, a configurable test set, and a wide output power level for full characterization of devices.

NI Modules Expand PXI Platform Capability, Reduce Cost for Semiconductor Characterization and Test
09/02/2011 | 1932
Digital per-pin parametric measurement and high-density source measure unit modules ideal for semiconductor. The NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

Tektronix Breaks Innovation Barrier and Delivers Transformational New Oscilloscope Category
08/30/2011 | 2056
World’s first mixed domain oscilloscope combines scope and spectrum analyzer functionality in a single instrument – providing time correlated analog, digital and RF signals.

Rohde & Schwarz enhances TV analyzer with drive test software that tests multiple channels and antenna options
08/18/2011 | 2052
With R&S BCDRIVE, broadcast transmitter operators can now also measure network coverage with drive tests. This solution even enables them to determine network coverage in parallel for multiple broadcasting channels, which significantly reduces measurement times.

National Instruments Extends Leading PXI RF Test Performance to 14 GHz
08/15/2011 | 1855
National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor. The new VSA features industry-leading phase noise and dynamic range, regardless of form factor, including traditional rack-and-stack instruments.

Anritsu Introduces High-Frequency Sampling Oscilloscope Probe
08/12/2011 | 1735
J1512A Passive Probe for BERTWave Series allows engineers to more efficiently verify designs of high-speed digital communications equipment and devices.

National Instruments Announces First Multicore CompactRIO With Intel® Core™ i7 Processor and Smallest NI Single-Board RIO Devices
08/08/2011 | 2037
Products expand the NI RIO Advanced Control and Monitoring Platform with higher-performance and smaller form factor targets.

Tektronix Acquires Optametra, Inc.
08/04/2011 | 2023
Combination of Optametra and Tektronix creates best-in-class analysis and performance to address emerging coherent optical standards.

Tektronix Unveils 33 GHz Oscilloscope With Industry’s Highest Measurement Accuracy
08/01/2011 | 2057
DPO/DSA70000D Series provides 100 GS/s sampling rate on 2 channels supporting today’s fastest signals for optical modulation analysis and SerDes validation.

Agilent Technologies' N6700 Modular Power System Family Adds Application-Specific Modules for Battery Test, Mobile Device Manufacturing
07/28/2011 | 2233
Agilent Technologies Inc. (NYSE: A) announced the addition of two new application-specific modules to the N6700 Modular Power System (MPS) family, the N6783A-MFG mobile communications DC power module and the N6783A-BAT battery charge/discharge module.


News 1261 - 1270 of 1371
First | Prev. | 125 126 127 128 129 | Next | Last
Site map|Privacy policy|Terms of Use & Store Policies|How to Buy|Shipping|Payment|© T&M Atlantic, Inc., 2010-2024