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Rohde & Schwarz adds WLAN signaling functions to its R&S CMW500 and R&S CMW270 multistandard test platforms
04/23/2012 | 1952
To achieve optimal results, WLAN user equipment needs to be tested under realistic operating conditions. The R&S CMW500 wideband radio communication tester and the R&S CMW270 wireless connectivity tester now have new options for accomplishing this task: In signaling mode, they can emulate a WLAN access point in line with IEEE 802.11a/b/g/n.

Agilent Technologies Introduces Innovative Multi-Measurement Signal Analyzer Capability for Wireless R&D
04/18/2012 | 1726
Agilent Technologies Inc. announced that an innovative, new multi-measurement capability is being added to its 89600 VSA software, enabling simultaneous signal analysis of multiple carriers and signal formats for more efficient testing and deeper signal insight in wireless test.

New Fluke Thermal Imagers Transform Market With Best-In-Class Focus and World-Renowned Ruggedness
04/16/2012 | 1579
Fluke Corporation introduces five new infrared cameras with a broad range of powerful yet easy-to-use capabilities.

New 4 GHz oscilloscope from Rohde & Schwarz delivers highest precision and acquisition rate in its class
04/11/2012 | 1865
Rohde & Schwarz continues to systematically broaden its oscilloscope portfolio, adding a 4 GHz model to its R&S RTO high-performance oscilloscope family. Together, the new R&S RTO1044 and the R&S RT-ZD40 differential probe (4.5 GHz bandwidth) are a powerful solution for developing digital, analog and RF designs.

Agilent Technologies Announces the Industry's First High-Speed AXIe Digitizer for Large-Scale Applied Physics
04/09/2012 | 1790
Agilent Technologies Inc. introduced the high-speed M9703A digitizer, the industry's first eight-channel, 12-bit digitizer that complies with the AXIe open standard. The AXIe digitizer is designed for use in large-scale applied physics applications.

Tektronix Delivers Thunderbolt™ Technology Test Solution
04/04/2012 | 1646
Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced a comprehensive test solution for Thunderbolt technology. Thunderbolt is a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements.

Keithley Introduces High Voltage System SourceMeter® Instrument optimized for High Power Semiconductor Test
03/28/2012 | 1743
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter® family of high speed, precision source measurement units.

Agilent Technologies Introduces Precision Waveform Analyzer Module With Industry-Best Performance
03/16/2012 | 1713
Agilent Technologies Inc. recently introduced a precision waveform analyzer for engineers involved in design verification and validation of high-speed electrical communications systems and components.

Tektronix to Provide First Automated Test Solution for MHL CTS 1.2
03/12/2012 | 1841
Integrated physical and protocol layer testing offers faster debug, analysis and MHL CTS 1.2 compliance testing.

Tektronix Announces High-Speed Optical Testing Toolset for Ethernet Standards
02/29/2012 | 1893
New optical modules for DSA8300 digital signal analyzer support optical compliance test up to 100G. This complete solution eliminates the need for additional test equipment such as optical-to-electric converters.


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