Tektronix, Inc. announced the availability of two new source measure unit (SMU) modules for the Keithley 4200A-SCS Parameter Analyzer that can perform low-current measurements even in the presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing this challenge are LCD display manufacturing and nano FET device testing on a chuck.
The new 4201-SMU and 4211-SMU are designed specifically for test setups with long cables, switch matrices, gate contacts to the chuck, and other fixturing. Such test setups, which are required in a number of low current measurement applications, can increase the capacitance seen at the output of the SMU, even though the device under test itself has very low capacitance. When the test connection capacitance is too high, the resulting low current measurements can become unstable.
To address these challenges, the new modules can source voltage and measure current with longer cables or more connection capacitance than possible using traditional SMUs. This saves researchers and manufacturing test engineers the time and cost that would otherwise be spent troubleshooting and reconfiguring test setups.
More details can be read following this link.