Anritsu Enhances Radio Communications Tester MT8821C to Support RF and PHY Layer Throughput Measurements for 6CA Terminals
Anritsu Company expands the measurement capability of its Radio Communications Analyzer MT8821C with the release of LTE-Advanced software solutions. When the new LTE-Advanced FDD DL CA 6CCs Measurement Software MX882112C-061 and LTE-Advanced TDD DL CA 6 CCs Measurement Software MX882113C-061 for LTE-Advanced/LTE Advanced Pro DL 6CA are installed, the MT8821C all-in-one solution supports RF and PHY layer measurements for 6 Carrier Aggregation (6CA) Single Input Single Output (SISO) and 6CA 2x2 Multiple Input Multiple Output (MIMO), as well as 6CA linked with Licensed Assisted Access (LAA).
With the two software options installed, the MT8821C can test RF TRx characteristics for 6 component carriers (6CC) CA. The software enhancements have been developed to provide engineers with a single-instrument solution to verify LTE/LTE-Advanced/LTE Advanced Pro mobile terminals and chipsets under development to address the explosive growth in high-bandwidth services, such as mobile video streaming.
The software is optimized by the high performance and unique design of the Radio Communications Analyzer MT8821C. The instrument has frequency coverage up to 6 GHz and a wide 160 MHz frequency bandwidth for both Tx and Rx measurements. The MT8821C all-in-one tester features built-in LTE/LTE-Advanced/LTE Advanced Pro terminal RF TRx test functions, as well as base-station simulation functions.
In addition to the capability offered with the new software, the MT8821C supports all cellular technologies compliant with 3GPP/3GPP2 UE RF TRX tests, including LTE/LTE-Advanced/LTE Advanced Pro, Cat-M1/NB-IoT, W-CDMA/HSPA, GSM/EGPRS, TD-SCDMA/HSPA, and CDMA2000 1X/1xEV-DO. The all-in-one tester can conduct measurements directly on the mobile device under test (DUT) to reduce measurement environment setup costs. A Parallelphone Measurement (PPM) feature allows a single MT8821C analyzer to perform simultaneous and independent testing of two UEs, lowering test costs and improving throughput by 50%.
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