IOLTS 2025

The 31st IEEE International Symposium on On-Line Testing and Robust System Design.

The IEEE International Symposium on On-Line Testing and Robust System Design explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.

The program includes keynotes, scientific paper presentations, and special sessions.

You are invited to participate and submit your contributions to IOLTS’25. The areas of interest include (but are not limited to) the following topics:

• Dependable system design
• Dependable Computer Architectures
• Design-for-Reliability
• Design for Reliability approaches for Low-Power
• Cross-layer reliability approaches
• Fault-Tolerant and Fail-Safe systems
• Functional safety
• Self-Test and Self-Repair
• Self-Healing design
• Self-Regulating design
• Self-Adapting design
• Reliability issues of Low-Power Design
• Robustness evaluation
• Quality, yield, reliability, and lifespan issues in nanometer technologies
  etc.

https://orion.polito.it/iolts/

Start Date:  07/07/2025
End Date:  07/09/2025
Venue:  Ischia, Italy
Organizer:  IEEE