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Industry news
12/12/2025 | 14
MVG (Microwave Vision Group), a global leader in measurement and services for evaluating human exposure to electromagnetic waves, announced the successful integration of the Anritsu Radio Communication Test Station MT8000A into its ComoSAR system. This integration, achieved through dedicated drivers for OpenSAR SW, covers the New Radio (NR) FR1 frequency range (sub 7.125 GHz).
12/10/2025 | 34
Yokogawa Electric Corporation announced the global release in all markets other than Japan of OpreX™ Intelligent Manufacturing Hub. By utilizing robotic process automation (RPA) implemented in a low-code / no-code environment or through customization by Yokogawa, this data integration solution can significantly reduce reporting time. OpreX Intelligent Manufacturing Hub covers the full range of key performance indicators (KPIs), workflows, and reporting at every level of the organization, from the C-suite to the plant floor, and employs a single database to integrate and display on dashboards data that customers need to make the right decision at the right time.
12/08/2025 | 41
Keysight Technologies, Inc. announced the Low-Power Double Data Rate 6 (LPDDR6) design and test solution, a complete design and test solution to support the next technology wave for memory systems. The solution significantly improves device and system validation, providing new test automation tools necessary for advancing AI, especially in mobile and edge devices.
12/05/2025 | 68
Rohde & Schwarz has successfully achieved full coverage of Skylo's comprehensive test plan for devices operating in Narrowband-IoT in Non-Terrestrial Networks (NB-NTN). This milestone also enables SMS services over NB-NTN, paving the way for unlimited connectivity on smartphones, wearables, and IoT devices.
12/03/2025 | 54
Anritsu Corporation is pleased to announce that the National Astronomical Observatory of Japan (NAOJ) has selected the Anritsu 400G Tester and Optical Spectrum Analyzer MS9740B for the evaluation of a new data transmission system (DTS) for the Atacama Large Millimeter/submillimeter Array (ALMA) located in Chile. The Network Master Pro MT1040A of the 400G Tester was used to evaluate the DTS communication function with 1.6 Tbps data transmission.
12/01/2025 | 64
Yokogawa Electric Corporation announced that it has developed the OpreX™ Open Automation SI Kit and the OpreX OPC UA Management Package, both of which will play important roles in the implementation of Open Process Automation™ (OPA) systems. The products will be available as part of the OpreX Control and Safety lineup.
11/28/2025 | 70
Keysight Technologies, Inc. launched AppFusion, a network visibility partner program that integrates third-party security and monitoring solutions directly into its network packet brokers. The program integrates market-leading technologies from Forescout, Instrumentix, and Nozomi Networks, enabling customers to streamline network and security operations (NetOps/SecOps) while significantly reducing infrastructure costs. This all-in-one, multi-vendor solution helps IT professionals reduce capital and operational expenses while improving security monitoring and performance.
11/26/2025 | 69
Anritsu Corporation and MediaTek have verified Advanced three uplink transmission (3TX) Technology featured in MediaTek's M80 5G Modem by using Anritsu's MT8000A all-in-one Radio Communication Test Station, providing a flexible test platform for ultrafast, large-capacity 5G communications. The MT8000A supports sub-6 GHz and mmWave RF tests, as well as protocol tests for development of advanced 5G technologies.
11/24/2025 | 97
Rohde & Schwarz invites to attend The AOC International Symposium & Convention, the premier event for electronic warfare, electromagnetic spectrum operations, cyber-electromagnetic activities, and information operations professionals from around the world.
11/21/2025 | 61
Yokogawa Test & Measurement Corporation announces the launch on April 14 of the AQ23211A and AQ23212A optical power meter modules (OPMs) as additions to the AQ2300 Series – a multi-application test system for manufacturers of semiconductor devices and optical components such as optical fibers.
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