ETS 2025

The 30^th IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, hot topics and new trends, as well as industrial case-studies and applications in the area of electronic-based circuits and systems testing, reliability, safety, security and validation.

The areas of interest include (but are not limited to) the following topics:

• 3D IC and SiP Test
• Analog, Mixed-signal and RF Test
• Approximate Circuit Testing
• ATE Hardware and Software
• Automatic Test Generation
• Automotive and Avionics Test
• Board Test and Diagnosis
• Built-In Self-Test
• Current-Based Test
• Defect-Based Test
• Delay and Performance Test
• Dependability
• Design for Test
• DfX (Design for Manufacturing, Reliability, Yield, etc.)
• Diagnosis and Silicon Debug
• Economics of Test
• Extra-Functional Aspects
• Failure Analysis
• Fault Modeling
• Fault Simulation
• Fault Tolerance
• Functional Safety
• Hardware Security
• Heterogeneous and Emerging Architectures
• High-Speed I/0 Test
• IoT and CPS Dependability
• Low-Power Test
• Machine Learning and Test
• Memory Test and Repair
• Microsystems / MEMS / Sensors Test
  etc.

https://ets2025.taltech.ee/

Start Date:  05/26/2025
End Date:  05/30/2025
Venue:  Swissotel in Tallinn, Estonia
Organizer:  Tallinn University of Technology (TalTech)  / IEEE Council on Electronic Design Automation (CEDA)