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Inspiring Innovations Step Into the Spotlight at 2014 International CES
12/30/2013 | 1756
Conferences, exhibits and TechZones to feature emerging tech trends.

Agilent Technologies Introduces New Software to Optimize Chemometric Profiling Workflows
12/25/2013 | 1564
Agilent Technologies Inc. (NYSE: A) introduced MassHunter Profinder software designed for batch processing of complex mass spectrometric data. The latest member of the MassHunter software family, MassHunter Profinder transforms chemometric peak-finding workflows with enhanced batch processing, robust re-mining and alignment capabilities.

CES is the world’s largest mobile technology event
12/23/2013 | 1735
AT&T Senior Executive Vice President John Donovan, Ericsson President and CEO Hans Vestberg, and Qualcomm Chairman and CEO Paul Jacobs to Keynote on Mobile Innovation at 2014 International CES.

The Embedded Revolution: NI Linux Real-Time and ARM
12/18/2013 | 2611
At NIWeek 2013, National Instruments unveiled a new operating system: NI Linux Real-Time. Between the keynote, NIWeek sessions, and media coverage, it’s evident that the release of this new real-time operating system (RTOS) is a significant milestone. Never mind the more than 60 man-years of engineering effort poured into the OS nor the joyous uproar from veteran users of NI’s embedded platform—in this feature, you will learn what this development means for you and will have a chance to participate in the contagious excitement around NI Linux Real-Time.

Rohde & Schwarz supports signal analysis in line with IEEE 802.11p for vehicle-to-vehicle communications
12/16/2013 | 1270
Rohde & Schwarz has expanded the functionality of its R&S FSV and R&S FSW signal and spectrum analyzers to also support the IEEE 802.11p wireless standard. The new R&S FSV-K91p and R&S FSW-K91p measurement options are especially designed for IEEE 802.11p compliant signal analysis in vehicle-to-vehicle (V2V) applications and intelligent transport systems (ITS).

Agilent Technologies Introduces Next-Generation Atomic Force Microscope
12/11/2013 | 1288
Agilent Technologies Inc. (NYSE: A) announced the availability of its 7500 atomic force microscope (AFM), a highly advanced instrument that establishes new performance, functionality and ease-of-use benchmarks for nanoscale measurement, characterization and manipulation. The Agilent 7500 achieves atomic resolution imaging with its 90 m AFM closed-loop scanner.

Spectracom Discontinuance Notice: GSG-L1 GPS Simulator
12/09/2013 | 2096
Spectracom’s GSG-L1 GPS Simulator is nearing end-of-life and has been replaced by GSG-51 and the GSG-5 Series GNSS Simulators. Last-time buy orders for the model GSG-L1 will be accepted until January 31st 2014, for delivery on or before June 30th, 2014.

Anritsu introduce error detector and other enhancements MP1800A to support 32.1Gbit/s BER measurement capability
12/04/2013 | 1297
The enhanced MP1800A is suitable for testing the backplanes, cables, and interconnects used in the next generation of ultra-high speed network equipment.

Rohde & Schwarz integrates up to 30 amp power switching module in production test systems for automotive electronics
12/02/2013 | 1269
Manufacturers of automotive electronics need test solutions that can also specifically distribute large current loads. Until now they have used specially developed, expensive power switching devices to do this. Rohde & Schwarz introduces a configurable power switching module that is fully integrated into the PXI-based R&S TSVP test system. It replaces auxiliary switching devices and is suitable for loads up to 30 A.

LabVIEW 8 DSC Simplifies Distributed Development
11/29/2013 | 1445
The NI LabVIEW 8 DSC Module directly adds logging, alarming, scaling, and initial value functionality to the new LabVIEW shared variable. National Instruments LabVIEW 8 delivers distributed intelligence as a unified communication and management platform for the rapid development of distributed applications. The NI LabVIEW 8 Datalogging and Supervisory Control (DSC) Module specifically addresses the unique requirements of developing distributed industrial measurement and control applications and high-channel-count monitoring applications.


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