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Tektronix Raises Bar for Oscilloscope Sampling Rates, Signal Integrity
11/10/2010 | 1493
The new real-time oscilloscope series DPO/DSA/MSO70000C deliver 100 GS/s sampling rate performance; enabling lower noise along with increased data points on 5x oversampled 20 GHz acquisitions. Faster compute platform and a more stable timebase are ideal for radar applications.

The First Portable Sync Tester/Analyzer For Next Generation Networks (NGN)
11/09/2010 | 1249
Spectracom, a company of the Orolia Group, announced its new portable field sync tester/analyzer Pendulum STA-61. Where traditional synchronization testers on the market are dedicated to do tests in one type of network or the other, the new Pendulum STA-61 can verify synchronization quality in traditional SDH/SONET core networks as well as IP-based backhaul and mobile networks. New product will be available in March 2011.

Introducing the complete line of Fluke IR Windows
11/06/2010 | 1229
The Fluke engineering team has developed a new IR Window specifically for indoor applications built on the tried and trusted technology of the existing outdoor CLKT line.

New R&S SMZ frequency multipliers with integrated attenuator deliver precise and adjustable output levels up to 110 GHz
11/04/2010 | 1261
The new R&S SMZ frequency multiplier family provides convenient microwave measurement capabilities in the 50 GHz to 110 GHz range. The frequency multipliers in the R&S SMZ family are the first on the market to offer users the choice of either mechanically or electronically controlled built-in attenuator options.

The return of Fluke 345 Power Quality Clamp Meter
11/03/2010 | 2173
Fluke is introducing the return of the world’s most advanced Power Quality Clamp Meter. The Fluke 345 has been re-designed due to the discontinuation of some major components. The instrument performance specification of the replacement product remains the same as the previous version. For the user the product is functionally identical, the item number stays the same as do the items shipped with the product.

Nobel Winners in Physics Used Keithley Instrumentation in Prize-Winning Research
11/01/2010 | 1127
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were recently awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties.

Agilent Technologies Introduces Tektronix-to-Agilent Probe Adapter, Expands Oscilloscope Value
10/29/2010 | 1335
Agilent Technologies Inc. introduced a Tektronix-to-Agilent probe adapter. The N2744A T2A adapter enables engineers to connect Tektronix TekProbe-BNC Level 2 probes to Agilent's Infiniium and InfiniiVision oscilloscopes.

Tektronix Enhances ‘World’s Most Popular Oscilloscope’ Series
10/26/2010 | 1264
The TDS2000C series of oscilloscopes offers performance gains, more models, more automated measurements, adds datalogging and limit test features.

Texas Instruments opens the company's first semiconductor manufacturing plant in China
10/22/2010 | 1166
Chengdu fab puts manufacturing close to growing customer base in China. The fab is a fully equipped 200mm manufacturing facility and was purchased from Cension Semiconductor Manufacturing Company.

Development and integration of embedded systems at electronica 2010
10/20/2010 | 1141
The world’s leading companies in the area of embedded hardware and software will meet at electronica 2010, the number 1 international trade fair for components, systems and applications in the electrical and electronics industry, from November 9 to 12, 2010. electronica 2010 will feature the latest generation of microprocessors, boards, development platforms and test software.


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