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Tektronix Introduces Optical Modules with Industry's Highest Sensitivity, Lowest Noise

Tektronix Introduces Optical Modules with Industry's Highest Sensitivity, Lowest Noise

03/31/2017

Tektronix, Inc., a leading worldwide provider of measurement solutions, introduced new optical modules for its DSA8300 sampling oscilloscope that feature the industry's highest mask test sensitivity and lowest noise along with new features that increase production capacity and improve yield for current 100G designs moving into production. The company also unveiled enhancements to its 400G test solution including IEEE Ethernet standard-driven Transmitter and Dispersion Eye Closure (TDECQ) PAM4 and related support measurements for optical testing.

The new modules and capabilities along with the full set of Tektronix solutions for 100G / 400G optical characterization and validation are being demonstrated at the OFC optical networking and communication conference and exhibition, taking place today through March 23, 2017 in Los Angeles, California.

"As 100G designs move into production, manufacturing yields become paramount," said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. "Our lowest inherent noise enables more confidence in test results and drives improvement in manufacturing yields on optical components and interconnects. At the same time, we continue to lead the way toward 400G with comprehensive tools and features for in-depth analysis and effective debug in a new generation of Data transmission."

When installed in DSA8300 sampling oscilloscopes, the new 80C17 and 80C18 optical modules provide mask test sensitivity of -14 dBm that exceeds requirements for 28 GBd PAM4 standards, while offering the industry's best noise performance at 3.9 µW with broad wavelength support. The two-channel 80C18 enables optical manufacturing test engineers to double throughput and capacity. If a device fails, Tektronix offers analysis tools to decompose the signal content for both noise and jitter to help engineers understand the underlying problem.

www.tek.com



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