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Rohde & Schwarz at DesignCon 2017

Rohde & Schwarz at DesignCon 2017

01/17/2017

Rohde & Schwarz is showcasing its test and measurement solutions at DesignCon 2017 expo from February 1 to 2 in Santa Clara, CA, at booth #841.

The company is featuring its test solutions for challenges in high speed digital design and signal integrity as well as its latest power integrity measurement solutions. The setups cover crosstalk measurements, PAM-4 measurements, high bit rate channel characterization, low noise probing for signal integrity, battery life analysis and high speed PCB probing and power integrity. Products showcased include high-end vector network analyzers such as the R&S ZNB up to 40 GHz and the R&S ZNBT multiport VNA up to 20 GHz, but also oscilloscopes such as the R&S RTO2000 and the corresponding probes portfolio. Moreover, the Rohde & Schwarz specialists will share their expertise in technical seminar sessions.

www.rohde-schwarz.com



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