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Rohde & Schwarz presents high-performance oscilloscopes at embedded world 2014

Rohde & Schwarz presents high-performance oscilloscopes at embedded world 2014

01/15/2014

Rohde & Schwarz continues to expand its oscilloscope portfolio for various fields of application. The T&M specialist will showcase many highlights in hall 4, booth 4-611 at the Exhibition Centre, Nuremberg, including:

Embedded design analysis with the user-friendly R&S RTM
Tailored to the demands of testing and developing electronic circuits, the new models in the R&S RTM family integrate time domain, logic, protocol and frequency analysis in a single device. The R&S RTM-B1 logic analysis option adds 16 logic channels to the R&S RTM. With a sampling rate of 5 Gsample/s and memory depth of 20 Msample, the R&S RTM is the best in its class for digital and analog channel performance, allowing users to precisely measure long signal sequences. The smart operating concept of the new R&S RTM models ensures extreme ease of use.

Power analysis with the R&S RTM and R&S RTO
The R&S RTM-K31 and R&S RTO-K31 power analysis options provide users with specialized measurement functions to automatically test the quality of modern switching power supplies – including the mains voltage quality of the input range and the safe operating area (SOA) of the switching transistor. A wizard guides the user through all measuring steps and provides diagrams illustrating where to connect current probes and other probes to the device under test. During power analysis, users will appreciate the high sensitivity and dynamic range of the R&S RTO and R&S RTM oscilloscopes. These properties allow the output ripple of power supplies to be characterized exactly and small voltages or currents in converters to be measured with precision.

Jitter analysis on clock and data signals with the R&S RTO
Jitter measurements are important when developing circuits that have serial high-speed data interfaces such as USB 2.0 or HDMI. The R&S RTO-K12 jitter analysis option offers automatic jitter measurements and a wide range of intelligent functions. For example, a wizard assists users with the most important measurements in order to obtain quick results. One particular challenge when analyzing jitter is the signal’s embedded clock that is used as a time reference, which is why the R&S RTO-K12 includes configurable software clock data recovery (CDR). The R&S RTO-K13 clock data recovery option provides users with a configurable hardware CDR. For the first time, users can trigger and analyze signals in realtime based on the embedded clock. Histograms and mask tests quickly return reliable results.

Compliance tests for USB 2.0 and Ethernet interfaces with the R&S RTO
A world without data transfer via Ethernet or USB is hard to imagine today. Rohde & Schwarz offers software options for the powerful R&S RTO oscilloscope that meet the testing needs of developers of such interfaces. The new R&S RTO-K22 Ethernet compliance test software includes automated tests for 10/100/1000BASE-T Ethernet interfaces in line with IEEE and ANSI test specifications. The R&S RTO-K21 USB 2.0 compliance test software includes test scenarios for USB 2.0 DUTs that serve as devices, hosts or hubs. Both options run on a PC that controls both the oscilloscope and the DUT. Image-based instructions provide step-by-step support during the measurements. Test results are automatically documented in the test report.

Rohde & Schwarz will present its entire portfolio of oscilloscopes at embedded world in Nuremberg in hall 4, booth 4-611. Trade journalists will have an opportunity to speak with press representatives on Tuesday, February 25 and Wednesday, February 26, 2014.

Rohde & Schwarz, www.rohde-schwarz.com



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