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Precise, fast, simple: Jitter analysis on clock and data signals with oscilloscopes from Rohde & Schwarz

Precise, fast, simple: Jitter analysis on clock and data signals with oscilloscopes from Rohde & Schwarz

06/24/2013

Jitter measurements are important when developing circuits with serial high-speed data interfaces such as USB 2.0 and HDMI. One particular challenge is the signal's embedded clock that is used as a time reference. Rohde & Schwarz addresses this requirement with new options for its R&S RTO high-performance oscilloscope.

To measure signal integrity reliably, developers need a powerful T&M instrument. The R&S RTO features an impressive low-noise frontend, high dynamic range ADC, high acquisition and analysis rate and a digital trigger system with extremely low trigger jitter. In addition to automatic jitter measurements, the new R&S RTO-K12 jitter analysis option offers a wide range of intelligent functions. For example: A wizard-driven menu assists users with the most important measurements in order to obtain quick results. Configurable software clock data recovery (CDR) was implemented for the automatic time interval error (TIE) measurement function. The track function shows the progression of measured values and their time correlation with the trace, opening up additional analysis options. Geometric box elements help users quickly create mask tests.

The new R&S RTO-K13 option’s configurable hardware CDR is integrated into the oscilloscope’s ASIC. This fully-integrated solution is the first to enable users to perform realtime triggering and signal analysis based on the embedded clock. Signal integrity on serial high-speed interfaces can be analyzed at a speed of up to 5 Gbps. Histograms and mask tests quickly return reliable results.

The new R&S RTO-K12 jitter analysis and R&S RTO-K13 clock data recovery options are now available from Rohde & Schwarz.

Rohde & Schwarz, www.rohde-schwarz.com



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