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60th IEEE Holm Conference

60th IEEE Holm Conference

08/15/2014

60th IEEE Holm Conference on Electrical Contacts is organized to provide a forum for the presentation and discussion of the latest developments in the field of electric contacts including research on materials, contact and connector designs, and the applications of these designs in electric, electronic and telecommunication equipment.

The Conference is oriented to Practicing designers, engineers, physicists and research scientists - those new to the field and those experienced.

The 2014 Holm Conference will include a proceeding given out at the beginning of the conference with about 70 presentations by US and international engineers and scientists. This provides an opportunity to study papers of interest before the actual presentation and promote better question and answer discussion during the conference. These papers and discussions of the papers provide the attendees with an up to date look at the research being done in the contact field.

Additionally, the conference provides a forum that allows attendees to meet and personally discuss the work of different authors and experts in the contact field. These exchanges provide a synergistic environment for further advancements in the electrical contact and connector field.

Expected Topics for discussions this year
Technical papers and workshops:

Fundamentals:

  • Contact Spots
  • Current Density
  • Contact Resistance

ARC fault / safety:

  • RF Spectrum
  • Algorithms
  • Diagnostics

Connectors:

  • Locomotive power connections
  • Crimp Terminals
  • LGA Sockets
  • Bolted Joints
  • Lubricants
  • Surface Coatings

Contact materials:

  • Plating
  • Silver Metal Oxides
  • Silver Alloys
  • Silver Graphite

Degradation mechanism:

  • Switching Performance
  • Tin Whiskers
  • Sliding & Fretting
  • Particle Contamination
  • Diagnostics
  • Lubrications

ARC Interruptions:

  • Circuit Breakers
  • DC Contactors
  • Relays
  • Magnetic Blowing
  • Bridge and Micro-Arcing
  • Material Transfer
  • Out Gassing Effect

Modeling:

  • FEM
  • Current Density
  • Contact Resistance
  • Fretting

New technology:

  • MEMS
  • Nanotubes

Find more details here.


Start Date:  10/12/2014
End Date:  10/15/2014
Venue:  Hilton New Orleans Riverside, New Orleans, LA USA
Organizer:  IEEE

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